Tang, Y.
, Sims, J.
and Kelley, M.
(2001),
Future Voltage Metrology at NIST, Proc., Measurement Science Conference, Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=1327
(Accessed December 6, 2024)
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Future Voltage Metrology at NIST
Published
Author(s)
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Abstract
Presently NIST uses a voltage calibration path to maintain the U.S. legal volt and provide for the dissemination of an internationally consistent, accurate, reproducible and traceable voltage standard, tied to the SI units. Potential improvements and enhancements to the present system will be discussed. These include using the quantum standard to replace artifact references, intercomparisons for future Josephson voltage standard systems, and the application of information technologies to voltage metrology.Proceedings Title
Proc., Measurement Science Conference
Conference Dates
January 18-19, 2001
Conference Location
Anaheim, CA
Pub Type
Conferences
Download Paper
Keywords
information technologies, quantum standard, voltage dissemination
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2000, Updated October 12, 2021