Zhou, Y.
, Zhang, Z.
, DeWitt, D.
and Tsai, B.
(2001),
Effects of Radiative Properties of Surfaces on Radiometric Temperature Measurement, 9th Intl. Conf. Advanced Thermal Processing of Semiconductors , Anchorage, AK, USA
(Accessed April 19, 2024)
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Effects of Radiative Properties of Surfaces on Radiometric Temperature Measurement
Published
Author(s)
Yong Zhou, Z M. Zhang, ,
Proceedings Title
9th Intl. Conf. Advanced Thermal Processing of Semiconductors
Conference Dates
September 25-29, 2001
Conference Location
Anchorage, AK, USA
Conference Title
Proc. 9th Intl. Conf. Advanced Thermal Processing of Semiconductors
Pub Type
Conferences
Citation
Created December 31, 2000, Updated October 12, 2021