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Effects of Radiative Properties of Surfaces on Radiometric Temperature Measurement

Published

Author(s)

Yong Zhou, Z M. Zhang, D P. DeWitt, Benjamin K. Tsai
Proceedings Title
9th Intl. Conf. Advanced Thermal Processing of Semiconductors
Conference Dates
September 25-29, 2001
Conference Location
Anchorage, AK, USA
Conference Title
Proc. 9th Intl. Conf. Advanced Thermal Processing of Semiconductors

Citation

Zhou, Y. , Zhang, Z. , DeWitt, D. and Tsai, B. (2001), Effects of Radiative Properties of Surfaces on Radiometric Temperature Measurement, 9th Intl. Conf. Advanced Thermal Processing of Semiconductors , Anchorage, AK, USA (Accessed April 22, 2024)
Created December 31, 2000, Updated October 12, 2021