Koepke, G.
, Hill, D.
and Ladbury, J.
(2000),
Directivity of the Test Device in EMC Measurements<sup>1</sup>, Proc., 2000 IEEE International Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA
(Accessed October 27, 2025)
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Directivity of the Test Device in EMC Measurements1
Published
Author(s)
, ,
Abstract
We present a statistical theory for estimating the directive characteristics of unintentional emitters based on the electrical size of the device. We compare this theory to directivity derived from pattern measurements in an anechoic chamber. We also use this theory to predict the maximum radiated fields based on total-radiated-power measurements in the reverberation chamber.Proceedings Title
Proc., 2000 IEEE International Electromagnetic Compatibility (EMC) Symposium
Conference Dates
August 21-25, 2000
Conference Location
Washington, DC, USA
Conference Title
IEEE Electromagnetic Compatibility Symposium
Pub Type
Conferences
Keywords
anechoic chamber, directive gain, directivity, electromagnetic compatibility, radiation pattern, reverberation chamber, statistical model
Citation
Issues
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Created November 30, 2000, Updated October 12, 2021