@conference{778436,
  author = {Galen Koepke and David Hill and John Ladbury},
  title = {Directivity of the Test Device in EMC Measurements<sup>1</sup>},
  year = {2000},
  month = {2000-12-01 00:12:00},
  publisher = {Proc., 2000 IEEE International Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA},
  language = {en},
}