TY - CONF AU - Galen Koepke AU - David Hill AU - John Ladbury C2 - Proc., 2000 IEEE International Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA DA - 2000-12-01 00:12:00 LA - en PB - Proc., 2000 IEEE International Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA PY - 2000 TI - Directivity of the Test Device in EMC Measurements1 ER -