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Bin Li, Li Shi, Paul S. Ho, JiPing Zhou, Richard A. Allen, Michael W. Cresswell
A new test structure has been designed and fabricated for the investigation of the effect of linewidth scaling on electron transport in nickel mono-silicide
Anastase Nakassis, Joshua Bienfang, P. Johnson, Alan Mink, D. Rogers, Xiao Tang, Carl J. Williams
Quantum cryptography asserts that shared secrets can be established over public channels in such a way that the total information of an eavesdropper can be made
Michael R. Souryal, Luke Klein-Berndt, Leonard E. Miller, Nader Moayeri
This paper presents the empirical results and analysis of a link variability study for an indoor, stationary 802.11 network subject to external interference
Alan Mink, Xiao Tang, Lijun Ma, Anastase Nakassis, Barry J. Hershman, Joshua Bienfang, David H. Su, Ronald Boisvert, Charles W. Clark, Carl J. Williams
NIST has developed a high-speed quantum key distribution (QKD) test bed incorporating both free-space and fiber systems. These systems demonstrate a major
Christoph J. Witzgall, Geraldine Cheok, Anthony J. Kearsley
The National Institute of Standards and Technology is involved in developing standard protocols for the performance evaluation of 3D imaging systems, which
Wonpil Yu, J A. Bain, Willard C. Uhlig, John Unguris
The usage of high moment FeCo alloys in magnetic recording heads can result in stress induced anisotropy due to the high magnetostriction constants of FeCo
In this position paper, we briefly describe the perspective of the US National Center for Ontological Research (NCOR, http://ncor.us) on ontology evaluation
The next generation of Product Data Exchange (PDE) standards will require the active participation of domain experts in the standards development process. Due
The printed circuit board (PCB) industry has been using the Gerber (RS-274) file format for decades, resulting in a substantial library of legacy designs. One
The international standard ISO 10303 (STEP) is being extended to permit the exchange of procedurally defined shape models, with additional parameterization and
Filippo Levi, Jon H. Shirley, Thomas P. Heavner, Dai Yu, Steven R. Jefferts
In this paper we analyze the behavior of the frequency shift caused by spurious spectral component in the microwave spectrum against variation of the excitation
Christopher W. Oates, Yann LeCoq, G Wilpers, Leo W. Hollberg
We report new measurements and modifications for a simple, compact, Ca atomic clock at 657 nm. External measurements were made against an independent Yb lattice
Vladislav Gerginov, V Shah, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
Progress towards simplification and improvement of the long-term stability of chip-scale atomic clocks is presented. The conventional technique of laser optical
Till P. Rosenband, Wayne M. Itano, Piet Schmidt, David Hume, Jeroen Koelemeij, James C. Bergquist, David J. Wineland
The differential polarizability, due to near-infrared light at 1126 nm, of the 27Al + 1S 0 – 3P 0 transition is measured to be {Δ}α = (1.6 ± x 10 -31 m 3, where
C Hoyt, Zeb Barber, Christopher W. Oates, A. V. Taichenachev, V. I. Yudin, Leo W. Hollberg
We report spectroscopy of the 1S 0 - 3P 0 clock transition in neutral 174Yb atoms confined to a one- dimensional optical lattice at the ac Stark shift-canceling
Ravikiran Attota, Richard M. Silver, M R. Bishop, Ronald G. Dixson
In this paper we present utility of the out of focus optical microscope images for metrology applications as opposed to the best focus images. Depending on the
R Katz, C D. Chase, R Kris, R Peltinov, John S. Villarrubia, B Bunday
The importance of Critical Dimension (CD) roughness metrics such as Line and Contact edge roughness (LER, CER) and their associated width metrics (LWR, CWR)
Leonard E. Miller, Perry F. Wilson, Nelson P. Bryner, Michael H. Francis, Jeffrey R. Guerrieri, D W. Stroup, Luke Klein-Berndt
An indoor localization and communication project is described that proposes to use RFID tags, placed in the building beforehand, as navigation waypoints for an
A direct comparison power measurement system has been developed to measure power sensor effective efficiency in the 100 kHz to 18 GHz frequency range. This
The Advanced Measurement Laboratory at NIST in Gaithersburg has already provided real, measurable improvement in some dimensional metrology measurement
Jean C. Scholtz, Mary F. Theofanos, Brian Antonishek
This paper discusses the development of a test bed to evaluate the combined performance of the human operator and an explosive ordnance disposal robot. We have
Who needs time and frequency? This paper answers that question by discussing the technologies and applications that rely on precise time and frequency, and
Our investigation concerns measuring broadband dielectric permittivity and loss tangent of thin film high dielectric constant (high-k) dielectric materials at