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High-Frequency Metrology at NIST: Current Programs and New Directions

Published

Author(s)

Dennis S. Friday, Ronald A. Ginley

Abstract

We provide an overview of the current state of high-frequency and microwave metrology programs at NIST, as well as a discussion of recent changes, emerging needs and exploratory new directions. A brief description of each of the core microwave metrology measurement services, (power, noise, scattering parameters, field strength, and antenna) is provided. Several of the newer programs, driven by needs which may lead to future measurements services, are also described.
Proceedings Title
Symposium of Metrology, CENAM
Conference Dates
October 22-25, 2006
Conference Location
Queretaro, 1, MX

Keywords

calibrations, Microwave metrology, nano-probing

Citation

Friday, D. and Ginley, R. (2006), High-Frequency Metrology at NIST: Current Programs and New Directions, Symposium of Metrology, CENAM, Queretaro, 1, MX (Accessed May 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 24, 2006, Updated October 12, 2021