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Transverse Stress Measured by Four-Polarization-State Frequency Domain Interferometry at High-Spatial Resolution

Published

Author(s)

Robert J. Espejo, Shellee D. Dyer

Abstract

We demonstrate a new method for measuring transverse stress with 11.8 υm spatial resolution in a fiber Bragg grating sensor, without the use of polarization maintaining fiber, by combining a four-state polarization analysis with a layer-peeling algorithm. Measurements of the externally induced birefringence agree well with predicted values.
Proceedings Title
18th International Conference on Optical Fiber Sensors Conference Technical Digest
Conference Dates
October 23-27, 2006
Conference Location
Cancun, 1, MX
Conference Title
18th International Conference on Optical Fiber Sensors

Keywords

fiber Bragg gratings, fiber optic sensors, layer peeling, optical frequency-domain interferometry, transverse strain sensors

Citation

Espejo, R. and Dyer, S. (2006), Transverse Stress Measured by Four-Polarization-State Frequency Domain Interferometry at High-Spatial Resolution, 18th International Conference on Optical Fiber Sensors Conference Technical Digest, Cancun, 1, MX, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32313 (Accessed July 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 22, 2006, Updated October 12, 2021