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The Performance Metrics for Intelligent Systems (PerMIS 2006) workshop was held during August 21-23, 2006 at the National Institute of Standards and Technology
Rising automation means fewer humans, maintaining more equipment, which is exchanging more information. This information torrent is expected to increase even
Margaret Huang, Herbert S. Bennett, Julio Costa, Peter Cotrell, Anthony A. Immorlica, Jan-Erik Meuller, Charles E. Weitzel, Marco Racaneli, Hisashi Schichijo, Bin Zhao
The International Technology Roadmap for Semiconductor (ITRS) Radio Frequency and Analog/Mixed-Signal (RF and AMS) Wireless Technology Working Group (TWG)
A piece of automation equipment such as a robotic crane for steel erection has no intrinsic knowledge of the process it automates. Thus, geometric and spatial
Roger V. Bostelman, Peter Russo, James S. Albus, Tsai Hong Hong, Rajmohan Madhavan
The National Institute of Standards and Technology (NIST) has recently studied a new 3D range camera for use on mobile robots. These robots have potential
John G. Hagedorn, Joy P. Dunkers, Adele P. Peskin, John T. Kelso, Lori Henderson, Judith E. Terrill
We describe a software system that enables the measurement and analysis of tissue engineering scaffold materials from three dimensional images. Essential to
Jens Mueller, Davor Balzar, Roy H. Geiss, David T. Read, Robert Keller
Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole
Eyal Gerecht, Dazhen Gu, Fernando Rodriquez-Morales, Sigfrid Yngvesson
Imaging and spectroscopy at terahertz frequencies (defined roughly as 300 GHz-3 THz) have great potential for both healthcare and homeland security applications
We use a rotating dihedral to determine the cross-polarization ratios of radar cross section measurement systems. Even a small amplitude drift can severely
First responders and incident management personnel need better training resources to prepare for future disasters. Live training exercises while valuable are
Jeffrey R. Guerrieri, Michael H. Francis, Perry F. Wilson, Leonard E. Miller, Nelson Bryner, David Stroup, Luke Klien-Berndt
An indoor localization and communication project is described that proposes to use RFID (radio-frequency identification) tags, placed in the building beforehand
Jean Deruelle, Mudumbai Ranganathan, Douglas C. Montgomery
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the
Richard A. Rouil, Nicolas Chevrollier, Nada T. Golmie
Unlike many intrusion detection systems that rely mostly on labeled training data, we propose a novel technique for anomaly detection based on unsupervised
David W. Berning, Allen R. Hefner Jr., J J. Rodriguez, Colleen E. Hood, Angel Rivera
A generalized 25 kV test bed developed to characterize high-voltage, high-power SiC devices is described. The test bed features containment of all high voltage
Allen R. Hefner Jr., Ryu Sei-Hyung, Hull Brett, David W. Berning, Colleen E. Hood, Jose M. Ortiz-Rodriguez, Angel Rivera-Lopez, Tam H. Duong, Adwoa Akuffo, Madelaine H. Hernandez
The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize commercial and military power
Chidubem Nwokoye, Mona E. Zaghloul, Michael W. Cresswell, Richard A. Allen, Christine E. Murabito
In mask fabrication, Critical Dimension (CD) metrology is conducted by optical transmission, Scanning Electron Microscopy (SEM), and Atomic Force Microscopy
Martin Stevens, Robert Hadfield, Robert E. Schwall, Sae Woo Nam, Richard Mirin
We report use of a niobium nitride superconducting single-photon detector in a time-correlated single-photon counting experiment. The detector has a timing
Dionisio Hernandez, Enrique Navarette, David Aviles, Yi-hua D. Tang
A comparison of Josephson Voltage Standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrologia (CENAM
S Brockmans, R Colomb, P Haase, E Kendall, Evan K. Wallace, G Xie
This paper presents an approach for visually modeling OWL DL and OWL Full ontologies based on the well-established visual modeling language UML. We discuss a
J Mallett, Ugo Bertocci, Erik B. Svedberg, John E. Bonevich, Alexander J. Shapiro, William F. Egelhoff Jr., Thomas P. Moffat
The electrodeposition of Cu_subscript (1-x)Pt_subscript(x) alloys by underpotential co-deposition of Cu with Pt is demonstrated using an H_subscript(2)SO
James Moyne, Jonathan Parrott, Naveen Kalappa, Ya-Shian Li-Baboud
In this presentation, the practical aspects of implementing time synchronization in today?s fabs will be discussed utilizing experimental analysis of industrial
Advancing to the next levels of Advanced Process Control (APC) requires the ability to intelligently merge existing and new data sources in order to refine
Stephen J. Treado, Mark A. Kedzierski, Stephanie S. Watson, Kenneth D. Cole
The quality of drinking water has always been a subject of interest. In fact, a stable and secure supply of clean drinking water is a hallmark of modern society
Laurence Lewis, Christopher L. Cromer, Krishna Ramadurai, Roop Mahajan, John H. Lehman
Today's standards for laser power and energy measurements are inadequate for tomorrow's high efficiency diode and fiber lasers. To meet this need, a new
Katie Hurst, Darryl A. Keenan, Anne Dillon, John H. Lehman
Laser treatment of bulk carbon single-walled nanotubes (SWNTs) using an excimer laser is demonstrated as a potentially simple and fast purification method
C Londono, John R. Lawall, Michael T. Postek, Jack A. Stone Jr., John R. Stoup
The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits
Quantification of mechanical properties, such as non-linear viscoelastic behavior, for filled elastomers (model nanocomposites) is complicated by the presence