Hernandez, D.
, Navarette, E.
, Aviles, D.
and Tang, Y.
(2006),
Josephson Voltage Standards Comparison Between CENAM and NIST at 10 V Level, The Conference Proceedings of Metrology Symposium 2006, Queretaro, 1, MX, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32319
(Accessed October 21, 2025)
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Josephson Voltage Standards Comparison Between CENAM and NIST at 10 V Level
Published
Author(s)
Dionisio Hernandez, Enrique Navarette, David Aviles,
Abstract
A comparison of Josephson Voltage Standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrologia (CENAM) held at CENAM from 21st to 23rd of March 2006 is reported. The comparison was made at the 10 V level by measuring four Zener references using the JVS of CENAM and the transportable Compact Josephson Voltage Standard (CJVS) of NIST. The difference between the measurements was -38 nV with an uncertainty of 42 nV at 95 % level of confidence.Proceedings Title
The Conference Proceedings of Metrology Symposium 2006
Conference Dates
October 25-27, 2006
Conference Location
Queretaro, 1, MX
Conference Title
The Metrology Symposium 2006
Pub Type
Conferences
Download Paper
Keywords
compact JVS, interlaboratory comparison, JVS, uncertainty
Citation
Issues
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Created September 30, 2006, Updated October 12, 2021