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Performance Metrics for Intelligent Systems (PerMIS) 2006 Workshop: Summary and Review

Published

Author(s)

Rajmohan Madhavan, Elena R. Messina

Abstract

The Performance Metrics for Intelligent Systems (PerMIS 2006) workshop was held during August 21-23, 2006 at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, USA. The PerMIS series (the current workshop is the sixth) is targeted at de ning measures and methodologies of evaluating performance of intelligent systems. PerMIS 2006 focused on applications of performance measures to practical problems in commercial, industrial, homeland security, and military applications. An important element of overall performance evaluation is that of assessing the technical maturity of a given technology or system. One approach for accomplishing this is known as Technology Readiness Level (TRL) assesment. TRL evaluations have been the focus of past PerMIS workshops and continue to be a foundational theme. This paper will provide an overview of the workshop and various topics that are closely related to the theme of the AIPR workshop.
Proceedings Title
Proceedings of the Applied Imagery Pattern Recognition Workshop |2006 | AIPR
Conference Dates
October 11-13, 2006
Conference Location
Washington, DC
Conference Title
Applied Imagery Pattern Recognition (AIPR)

Keywords

measures and evaluation, performance metrics, TRL

Citation

Madhavan, R. and Messina, E. (2006), Performance Metrics for Intelligent Systems (PerMIS) 2006 Workshop: Summary and Review, Proceedings of the Applied Imagery Pattern Recognition Workshop |2006 | AIPR, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823605 (Accessed April 14, 2024)
Created October 13, 2006, Updated February 19, 2017