Performance Metrics for Intelligent Systems (PerMIS) 2006 Workshop: Summary and Review

Published

October 13, 2006

Author(s)

Rajmohan Madhavan, Elena R. Messina

Abstract

The Performance Metrics for Intelligent Systems (PerMIS 2006) workshop was held during August 21-23, 2006 at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, USA. The PerMIS series (the current workshop is the sixth) is targeted at de ning measures and methodologies of evaluating performance of intelligent systems. PerMIS 2006 focused on applications of performance measures to practical problems in commercial, industrial, homeland security, and military applications. An important element of overall performance evaluation is that of assessing the technical maturity of a given technology or system. One approach for accomplishing this is known as Technology Readiness Level (TRL) assesment. TRL evaluations have been the focus of past PerMIS workshops and continue to be a foundational theme. This paper will provide an overview of the workshop and various topics that are closely related to the theme of the AIPR workshop.

Proceedings Title

Proceedings of the Applied Imagery Pattern Recognition Workshop |2006 | AIPR

Conference Dates

October 11-13, 2006

Conference Location

Washington, DC

Conference Title

Applied Imagery Pattern Recognition (AIPR)

Pub Type

Conferences

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Keywords

measures and evaluation, performance metrics, TRL

Citation

Madhavan, R. and Messina, E. (2006), Performance Metrics for Intelligent Systems (PerMIS) 2006 Workshop: Summary and Review, Proceedings of the Applied Imagery Pattern Recognition Workshop |2006 | AIPR, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823605 (Accessed December 10, 2024)