Georges Grinstein, Theresa O'Connell, Sharon J. Laskowski, Catherine Plaisant, Jean Scholtz, Mark Whiting
Visual analytics experts realize that one effective way to push the field forward and to develop metrics for measuring the performance of various visual analytics components is to hold an annual competition. The first Visual Analytics Science and Technology (VAST) contest was held in conjunction with the 2006 IEEE Visualization Conference. The competition entailed the identification of possible political shenanigans in the fictitious town of Alderwood. A synthetic data set was made available as well as tasks. We summarize how we prepared and advertised the contest, developed some initial metrics for evaluation, selected winners, and ran an additional live competition at the conference to provide the winners feedback from senior analysts.
Proceedings of the Institute of Electrical and Electronics Engineers (IEEE) Visual Analytics Science and Technology 2006
October 31-November 2, 2006
Baltimore, MD, US
Institute of Electrical and Electronics Engineers (IEEE) Visual Analytics Science and Technology 2006
, O'Connell, T.
, Laskowski, S.
, Plaisant, C.
, Scholtz, J.
and Whiting, M.
VAST 2006 Contest - A tale of Alderwood, Proceedings of the Institute of Electrical and Electronics Engineers (IEEE) Visual Analytics Science and Technology 2006, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50866
(Accessed December 11, 2023)