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Conferences

Leakage Effects on Microwave Power Measurements

Author(s)
Ronald A. Ginley, Denis X. LeGolvan, Ann F. Monke
Microwave power measurements are used to support almost every every segment of the microwave electronics industry. It is very important for these measurements

Spherical Rubidium Vapor Cells Fabricated By Micro Glass Blowing

Author(s)
E. J. Eklund, A Shkel, Svenja A. Knappe, Elizabeth A. Donley, John E. Kitching
This paper presents an application of micro glass blowing, in which multiple glass spheres are simultaneously shaped on top of a silicon wafer and subsequently

Long-Term Stability of Chip-Scale Atomic Clock Physics Packages

Author(s)
Svenja A. Knappe, Vladislav Gerginov, V Shah, Alan Brannon, Hugh Robinson, Leo W. Hollberg, John E. Kitching
We present measurements regarding the long-term stability of chip-scale atomic clock (CSAC) physics packages. The tight requirements for the temperature

Hemispherical Imaging of Skin With Polarized Light

Author(s)
J C. Ramella-Roman, Bruno Boulbry, Thomas A. Germer
Polarized light imaging has been used in the past for skin-cancer edge detection from skin lesions. In the standard imaging modality, the source, detector, and

DHS/NIST Response Robot Evaluation Exercises

Author(s)
Adam S. Jacoff, Elena R. Messina
The Department of Homeland Security, through the Science and Technology Directorate Standards Program, is developing performance standards for robots applied to

Web Application Scanners: Definitions and Functions

Author(s)
Elizabeth N. Fong, Vadim Okun
There are many commercial software security assurance tools that claim to detect and prevent vulnerabilities in application software. However, a closer look at

Roundness Measurements Using the NIST Fiber Probe

Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have described a fiber probe for dimensional measurement of micro-holes in the 2004 and 2006 ASPE annual meetings. In this abstract, we describe the
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