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Conferences

Phase-dispersion light-scattering for quantitative size-imaging of spherical scatters

January 19, 2007

Author(s)

Tasshi Dennis, Shellee D. Dyer, Andrew Dienstfrey

Using phase-dispersion spectra measured with optical coherence tomography (OCT) in the frequency domain, we demonstrated the quantitative sizing of multiple

Radian-level coherent optical links over 100's of meters and 100's of terahertz

January 18, 2007

Author(s)

Ian R. Coddington, Qudsia Quraishi, Luca Lorini, William C. Swann, J. C. Bergquist, C. W. Oates, Scott Diddams, Nathan R. Newbury

We demonstrate coherent transfer of optical signals with radian level noise (in a 25 MHz bandwidth) through a series of laser systems spanning from 657 nm to

Hemispherical Imaging of Skin With Polarized Light

January 15, 2007

Author(s)

J C. Ramella-Roman, Bruno Boulbry, Thomas A. Germer

Polarized light imaging has been used in the past for skin-cancer edge detection from skin lesions. In the standard imaging modality, the source, detector, and

DHS/NIST Response Robot Evaluation Exercises

January 8, 2007

Author(s)

Adam S. Jacoff, Elena R. Messina

The Department of Homeland Security, through the Science and Technology Directorate Standards Program, is developing performance standards for robots applied to

Web Application Scanners: Definitions and Functions

January 3, 2007

Author(s)

Elizabeth N. Fong, Vadim Okun

There are many commercial software security assurance tools that claim to detect and prevent vulnerabilities in application software. However, a closer look at

Manufacture and Metrology of 300 mm Silicon Wafers with Ultra-Low Thickness Variations

January 2, 2007

Author(s)

Ulf Griesmann, Quandou (. Wang, Marc Tricard, Paul Dumas, Christopher Hill

With the evolution of exposure tools for optical lithography towards larger numerical apertures, the semiconductor industry expects continued demand for

Characterization of a Low Thermal Scanner for Automatic Voltage Measurement with the NIST Josephson Voltage Standard

January 2, 2007

Author(s)

Shiv K. Jaiswal, June E. Sims, Yi-hua D. Tang

In order to increase the capacity of the NIST 10V Josephson Voltage Standard System for automatic calibration of Zener reference standards from the present 32

Structural Collapse Research at NIST

January 1, 2007

Author(s)

D W. Stroup, Nelson P. Bryner

Approximately 20 % of fire fighters killed at structure fires over the past ten years have been as a result of structural collapse. Predicting a structural

Testing and Monitoring E-Business Using the Event-Driven Test Scripting Language

January 1, 2007

Author(s)

Boonserm Kulvatunyou, J Durand, Jungyub Woo, M Martin

This paper addresses challenges associated with conformance and interoperability testing of today's e-business technologies and proposes a new approach that

Database Demonstration Sessions at ICAMDATA-5, ed. by E. Roueff

January 1, 2007

Author(s)

Yuri Ralchenko, D. R. Schultz

An Interactive Procedure for Efficient Testing of B2B: A Case in Messaging Service Tests

January 1, 2007

Author(s)

Boonserm Kulvatunyou, Jaewook Kim

Testing is a necessary step in systems integration. Testing in the context of cross-enterprise business-to-business (B2B) integration is more difficult and

Hydrosomes: Optically Trapped Water Droplets as Nanocontainers, ed. by K. Dholakia and G.C. Spalding

January 1, 2007

Author(s)

Kristian Helmerson, J E. Reiner, Alice M. Crawford, Ana Jofre, Rani B. Kishore, Lori S. Goldner, Jianyong Tang, M E. Greene, M K. Gilson

Fundamental Limits of Optical Critical Dimension Metrology: A Simulation Study

January 1, 2007

Author(s)

Richard M. Silver, Thomas A. Germer, Ravikiran Attota, Bryan M. Barnes, B Bunday, J Allgair, Egon Marx, Jay S. Jun

This paper is a comprehensive summary and analysis of a SEMATECH funded project to study the limits of optical critical dimension scatterometry. The project was

Controlling the Optical Properties of Quantum Dots and Nanocrystals Using Size, Composition and Strain, ed. by Kurt G. Eyink, Diana L. Huffaker, and Frank Szmulowicz

January 1, 2007

Author(s)

Garnett W. Bryant, J G. D{iacute}az, M Zielinski, W Jask{oacute}lski

Tolerancing Form Deviations for NIST Standard Reference Material (SRM) 2809 Rockwell Diamond Indenters

January 1, 2007

Author(s)

Jun-Feng Song, Samuel R. Low III, Li Ma

The National Institute of Standards and technology (NIST) plans to develop Standard Reference Material (SRM) 2809 Rockwell Diamond Indenter to support Rockwell

Database Demonstration Sessions at ICAMDATA-5, ed. by E. Roueff

January 1, 2007

Author(s)

Yuri Ralchenko, D. R. Schultz

Laser Trackers: Testing and Standards

January 1, 2007

Author(s)

Steven D. Phillips

Laser trackers are now the tool of choice for large scale coordinate metrology. They are transportable allowing reconfigurable production facilities at a lower

Hydrosomes: Optically Trapped Water Droplets as Nanocontainers, ed. by K. Dholakia and G.C. Spalding

January 1, 2007

Author(s)

Kristian Helmerson, J E. Reiner, Alice M. Crawford, Ana Jofre, Rani B. Kishore, Lori S. Goldner, Jianyong Tang, M E. Greene, M K. Gilson

Control of interfacial adhesion by polymer brushes

January 1, 2007

Author(s)

Heqing Huang, Xuesong Hu, Christopher M. Stafford

Controlling the Optical Properties of Quantum Dots and Nanocrystals Using Size, Composition and Strain, ed. by Kurt G. Eyink, Diana L. Huffaker, and Frank Szmulowicz

January 1, 2007

Author(s)

Garnett W. Bryant, J G. D{iacute}az, M Zielinski, W Jask{oacute}lski

Wetting Behavior on Microscale Wrinkled Surfaces

January 1, 2007

Author(s)

Jun Y. Chung, Christopher M. Stafford

We present a systematic study of the wetting behavior on the anisotropic microstructure having a simple sinusoidal profile. The micro-patterned surface was