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Extreme Ultraviolet Lithography (EUVL) incorporates 13.5 nm light for patterning wafers and requires in-situ wafer-plane dosimetry that can be tailored to the...
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively...
In this paper, we describe the process by which we collected sensor data for the evaluation of 3D LIDAR (Light Detection and Ranging). Data was also collected...
Stephanie S. Watson, Tarek Marray, Yongyan Pang, Li Piin Sung
Metal oxide fillers, such as titanium dioxide (TiO2) are commonly used in building and construction applications and are added to increase the opacity and/or to...
John E. Kitching, Svenja A. Knappe, William C. Griffith, Jan Preusser, V Gerginov, Peter D. Schwindt, Vishal Shah, Ricardo Jimenez Martinez
We summarize recent results at NIST to develop high-performance yet highly miniaturized magnetic sensors based on atomic vapors confined in microfabricated...
Background The U.S. Centers for Disease Control and Prevention (CDC) has reported that half of non-fatal CO poisoning incidents during the hurricane season in...
Over the last thirty years, much research has been done on the development of failure event databases and fatigue modeling of crack growth in pressure vessels...
Paul D. Over, George M. Awad, Alan Smeaton, Colum Foley, James Lanagan
This paper begins by considering a number of important design questions for a web-scale, widely available, multimedia test collection intended to support long...
Nenad Ivezic, Hyunbo Cho, Jungyub Woo, Jun H. Shin, Jaewook Kim, Mohammad Abidi, Asuman Dogac, Tuncay Namli, Christine Legner, Francois Fischer
We describe an initial effort to create a comprehensive and coherent framework for feasibility analysis of the Global Interoperability Test Bed for eBusiness...
We derive a model of congestion control where the trade-off between utility and path diversity can be investigated. In a network where there can be multiple...
Chen Wang, Liangchun (. Yu, Jason P. Campbell, Kin P. Cheung, Yi Xuan, Peide Ye, John S. Suehle, David Zhang
Fast Id-Vg measurements on very high performance devices (very low channel ON-resistance) and larger area devices (therefore large gate capacitance) are subject...
William M. Pitts, Gregory Hasapis, Patrick Macatangga
A series of experiments designed to characterize fire spread and growth on flat samples of commercial non-fire-retarded flexible polyurethane foam have been...
This study compared random and t-way combinatorial inputs of a network simulator, to determine if these two approaches produce significantly different deadlock...
A major aerospace company operates large factories that involve thousands of component parts, subassemblies, major sub-systems, tools, fixtures, and material...
Kenneth A. Snyder, Paul E. Stutzman, Jacob Philip, David W. Esh
The hydration products of varying proportions of portland cement, fly ash, ground granulated blast furnace slag, and silica fume in blended systems were...
Jinan Zeng, Howard W. Yoon, George P. Eppeldauer, Leonard M. Hanssen, Joseph P. Rice
The spectral irradiance responsivity calibrations of InSb radiometers measured on the tunable-laser based Infrared Spectral Irradiance and Radiance Responsivity...
The National Institute of Standards and Technology (NIST) is leading an effort to develop performance standards for ur- ban search and rescue robots (US&R). An...
The purpose of this study is to develop relevant metrology to measure the appropriate structure-property relationship at a proper length scale to understand the...
The Common Vulnerability Scoring System (CVSS) is a specification that is used to measure the relative severity of software vulnerabilities. CVSS version 2...
Ryan P. Birringer, Roey Shaviv, Thomas Mountsier, Jon Reid, Jian Zhou, Roy H. Geiss, David T. Read, Reinhold Dauskardt
Effects of the chemistry of electroplated copper films on stress-induced voiding and adhesion between the films and a SiN barrier layer are reported. The void...
Jun-Feng Song, Thomas Brian Renegar, Xiaoyu Alan Zheng, Robert M. Thompson, Richard M. Silver, Martin M. Ols, Ted T. Vorburger
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the...
We theoretically investigate a single emitter embedded in a hybrid optical waveguide that proves highly efficient, optical fiber access to the dipole transition...
A compact scheme for high-speed frequency doubling and down-conversion on a single dual-element PPKTP waveguide is investigated. Optimal temperature selection...
David E. Gilsinn, Bruce R. Borchardt, Amelia Tebbe
The volumes of two industrially molded non-metallic artifacts were estimated using surface data obtained by a coordinate measuring machine. A tensor product of...
Bernd Bodermann, Detleff Bergmann, Egbert Buhr, Wolfgang Haebler-Grohne, Harald Bosse, James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Ndubuisi George Orji
In preparation of the international Nano1 linewidth comparison on photomasks between 9 national metrology institutes, NIST and PTB have started a bilateral...
John L. Michaloski, Byeong Eon Lee, Frederick M. Proctor, Sid Venkatesh, Sidney Ly
In the CNC manufacturing world, the continuing pressure to reduce costs and improve time to market places a premium on smarter ways of manufacturing and...
Tommy Chang, Tsai H. Hong, Milli Shah, Roger D. Eastman
In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception...