Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Wafer-level Hall Measurement on SiC MOSFET

Published

Author(s)

Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng
Proceedings Title
Silicon Carbide and Related Materials 2009
Conference Dates
October 11-16, 2009
Conference Location
Nuremberg
Conference Title
International Conference on Silicon Carbide and Related Materials

Citation

Yu, L. , Cheung, K. , Tilak, V. , Dunne, G. , Matocha, K. , Campbell, J. , Suehle, J. and Sheng, K. (2009), Wafer-level Hall Measurement on SiC MOSFET, Silicon Carbide and Related Materials 2009, Nuremberg, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905438 (Accessed March 29, 2024)
Created October 11, 2009, Updated February 19, 2017