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Wafer-level Hall Measurement on SiC MOSFET

Published

Author(s)

Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng
Proceedings Title
Silicon Carbide and Related Materials 2009
Conference Dates
October 11-16, 2009
Conference Location
Nuremberg
Conference Title
International Conference on Silicon Carbide and Related Materials

Citation

Yu, L. , Cheung, K. , Tilak, V. , Dunne, G. , Matocha, K. , Campbell, J. , Suehle, J. and Sheng, K. (2009), Wafer-level Hall Measurement on SiC MOSFET, Silicon Carbide and Related Materials 2009, Nuremberg, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905438 (Accessed July 13, 2024)

Issues

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Created October 11, 2009, Updated February 19, 2017