@conference{31991,
  author = {Liangchun Yu and Kin Cheung and Vinayak Tilak and Greg Dunne and Kevin Matocha and Jason Campbell and John Suehle and Kuang Sheng},
  title = {Wafer-level Hall Measurement on SiC MOSFET},
  year = {2009},
  month = {2009-10-11},
  publisher = {Silicon Carbide and Related Materials 2009, Nuremberg, -1},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905438},
  language = {en},
}