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Projects/Programs

Displaying 126 - 150 of 261

METIS

Ongoing
A Metrology Exchange to Innovate in Semiconductors

RF Metrology for High-Frequency Transistor Models

Ongoing
Due to the challenges of high-frequency measurements, that includes inaccuracy in on-wafer calibration and a lack of instrumentation for transistor characterization, models are currently extracted from low frequency measurements and extrapolated to higher frequencies. This methodology has been shown

Metrology for Integration of New Magnetic Materials

Ongoing
Integration of magnetic materials remains a key challenge facing advanced packaging technologies. High power applications require voltage conversion at or near the die, and most practical power converters rely on inductors. Beyond power electronics, integration of magnetic components such as

metRology for Microsoft Excel

Ongoing
DESCRIPTION: The current version of the metRology for Microsoft Excel add-in focuses on uncertainty analysis using the methods outlined in the JCGM Guide the Expression of Uncertainty in Measurement (often referred to as the GUM). These methods for uncertainty analysis are widely accepted and their

Metrology of the Ohm

Ongoing
The Metrology of the Ohm Project has been a leader in providing internationally consistent resistance standards that are readily available to support the scientific and industrial foundations of the U.S. economy. Through this very broad customer base, the activities of the project enable cost

Metrology for Printing and Graphic Arts Substrates

Ongoing
Paper is a complex, heterogeneous, multi-phased material. While there is a significant body of work related to the dielectric properties of cellulose, comparatively fewer studies have been done on printing and writing grades of paper. In our previous work, we have been able to differentiate between

Metrology of Purity and Contaminants in Solid Materials

Ongoing
Purity evaluations of high-purity bulk materials used in chips manufacturing are calibrated against reference materials that are often not matrix-matched to the materials under test. In other words, differences in the compositions of the calibrants and the samples being analyzed can result in large

Metrology for Real-Time Monitoring of Additive Manufacturing

Completed
Objective To develop and disseminate metrology methods, tools, data, and standards applied to in-situ monitoring of AM processes, such that manufacturers and their customers can accurately and precisely determine the quality of the fabrication process and resulting parts. What is the Technical Idea

metRology Software Project

Ongoing
DESCRIPTION: The current version of the metRology package focuses on statistical functions for uncertainty analysis and for the analysis of interlaboratory studies and key comparisons. A number of the functions focus on uncertainty analysis using the methods outlined in the JCGM Guide to the

Metrology and Standards for Canine Olfactory Detection of Explosives

Completed
Effective and accepted by the public, trained dogs are the most frequently deployed detection systems for identification of explosives threats in mobile applications. In addition to being highly sensitive, dogs can rapidly discriminate the unique profile of an explosive in a presence of a large

Micronutrients Measurement Quality Assurance Program (MMQAP)

Completed
The MMQAP supported the long-term (months to years) reliability of selected fat- or water-soluble vitamin measurements in human serum and plasma. Results from the comparison studies helped participants to make accurate clinical and health-care decisions as well as to maintain and improve their

Microscopy Methods

Completed
Due to projection effects, analytical transmission electron microscopy (AEM) of thinned or sectioned samples has traditionally been limited to essentially two-dimensional imaging and analysis. Current nanometer scale devices are too small and complex for current sectioning capabilities and two

Microsystems for Harsh Environment Testing

Completed
Classically, measurement of the mechanical properties and reliability of bulk-scale materials is performed with macroscopic specimens and methods. Specimen preparation limitations, miniaturized load-frame tooling problems, and inadequate understanding of the roles of specimen size and constraint on

Multiscale Modeling and Validation of Semiconductor Materials and Devices

Ongoing
The limitations of scaling traditional CMOS (complementary metal-oxide semiconductors) designs have necessitated that the semiconductor industry consider new materials and design concepts. For wide bandgap semiconductor devices, optimization of materials and fabrication processes is needed to

Nanocalorimetry Measurements

Ongoing
Accurate thermodynamic measurements are essential to understand fundamental properties of materials, providing direct and quantifiable insight into the thermodynamics of thin film reactions and phase transitions. Going forward, new classes of materials may only be synthesized as thin films, a scale

Nanometer Scale Measurements of Crack Tips in Glass

Ongoing
Our approach is to fracture glass samples under controlled conditions in order to elucidate fracture mechanisms. Specimen geometries with well-defined fracture mechanics behavior are used to propagate cracks at controlled velocities ranging from 10-11 m s-1 to 102 m s-1. Fracture surfaces are then

Nanoscale, Element-Specific X-ray Imaging for Integrated Circuit Metrology

Ongoing
Industry roadmaps identify the characterization of nanoscale subsurface feature shape and composition as a measurement need for the semiconductor industry. However, IC interiors are difficult to probe post-manufacturing due to the presence of many close-packed and nanoscale subsurface features, of

Nanoscale Thermal Properties

Completed
It is known that at the nanoscale, composition and interface structure play important roles in determining the mechanical, thermal, and electrical properties of multiphase nanomaterials and nanocomposites. To probe the thermal properties of these heterogeneous nanomaterials, local thermal analysis

The Nanotechnology Xccelerator

Ongoing
The Nanotechnology Xccelerator was announced on September 13, 2022 and was officially accepted for production at Skywater Technology Foundry using the Sky130 technology in Q1 2024. Sky130, which comes in both a conventional and open-source process design kit, is a 5-metal layer process. To

Nanotribology for Nanomanufacturing (Archived)

Completed
Friction and wear are major causes of mechanical failures and dissipative energy losses. These shortfalls account for a significant portion of the annual gross domestic product in the United States, amounting to approximately $800 billion in 2010. It is estimated that tens of billions of U.S

Nanotube Metrology

Completed
Single-wall carbon nanotubes (SWCNTs) are a tubular form of carbon consisting of a single shell of sp2 bonded carbon with a nanometer scale diameter that have many predicted properties superior to other available materials. However, every production technique for SWCNTs produces many different

National Type Evaluation Program (NTEP)

Ongoing
NTEP requires industry to submit prototype weighing devices for evaluation to determine whether or not it meets the uncertainties which are related to tolerances associated with the intended final use in the marketplace. All devices sold in the United States for "legal for trade" purposes must pass

Nature of the Threat

Ongoing
"Improving Particle Collection Efficiency of Sampling Wipes used for Trace Chemical Detection", Gillen, Greg and Lawrence, Jeffrey and Sisco, Edward and Staymates, Matthew E. and Verkouteren, Jennifer and Robinson, Elizabeth L. and Bulk, Alexander, Anal. Methods, 14, 581-587 (2022). http://dx.doi