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Electronics

Projects/Programs

Keyword

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This project supports the metrology of advanced electronic circuits and systems through many activities centered around accurate measurements and characterizations, improving device models and designs, enabling traceability of complicated electronics systems, and incorporating advanced technologies...

Ab initio theoretical modeling for predicting structure and properties in advanced materials

Ongoing

Project activities include: Electronic structure of semiconductor-oxide interfaces. Thermodynamics of flexible microporous materials for gas storage Gas adsorption in microporous materials Analysis of topological materials, including magnetic topological insulators High-throughput screening of...

Small array of transistors designed for single device integration.

Integrated CMOS Testbeds for Nanoelectronics and Machine Learning

Ongoing

The increasingly complex device requirements for next-generation computing architectures such as neuromorphic computing or nanoelectronic machine learning accelerators present challenges for researchers across the spectrum of institutions, from small businesses and universities to government...

Integrated Testbeds for Advanced Metrology

Ongoing

Crossbar Memory Arrays An especially prolific structure in memory architectures aimed at accelerating neural network operation is the crossbar array (Fig. 1). We produce medium-scale arrays that hold up to 20,000 nanodevices which can be characterized, read from, and written to individually or in...

Light-matter interactions in Semiconductor Nanostructures

Ongoing

We investigate the interaction of light with semiconductor-based nanostructures. We extend concepts of entanglement and coherence in atomic physics to our solid-state systems. Our devices are based on semiconductors, like GaAs. We use InAs quantum dots (QDs) in GaAs as artificial atoms; they have...

Magnetic Random Access Memory

Ongoing

Focus areas include (1) the fundamental understanding of the interactions between spin and magnetic materials and materials with large spin-orbit scattering; (2) the nonlinear dynamics of both individual and interacting nanoscale magnetic systems; and (3) the role of thermal noise in nanomagnetic...

Custom-built wafer level probes in position to perform EDMR measurements on fully processed transistors.

Magnetic Resonance Spectroscopy

Ongoing

Custom-built wafer level probes in position to perform EDMR measurements on fully processed transistors. Electronics are all around us and have completely reinvented nearly every aspect of our society. Virtually any system, large or small, contains some type of electronics that may or may not be...

Massively Parallel Reliability Test Platform

Ongoing

Statistical measures of various wear-out/reliability aging mechanisms across large populations of semiconductor devices.

Measurements of Point-Defect Chemistry in Complex Oxides

Ongoing

Project Goal: To develop magnetic resonance, x-ray absorption, electron diffraction, and electrical conductivity measurements to better characterize dilute concentrations of point defects in oxide materials and effectively correlate electro-mechanical properties to measured defect chemistry. Oxide...

A line drawing of a woman's head styled like a classical carved bust

METIS

Ongoing

A Metrology Exchange to Innovate in Semiconductors

Schematic diagram of a 3D stacked integrated circuit (3D-SIC), achieved using copper through-silicon via interconnects.

Metrology for Emerging Integrated Systems

Completed

The Emerging Integrated Systems Metrology program supports measurements for advanced manufacturing and secure nano-manufacturing, novel devices and electronic materials. Specifically, the program aims to develop the metrology required to enable a quantitative assessment and physical understanding of...

Metrology for extreme ultraviolet lithography

Ongoing

Patterning with light 13 nm brings a host a new challenges Light at 13 nm is well within the vacuum ultraviolet, where radiation is strongly absorbed by all materials. This requires that the technology take place in vacuum and rely on mirrors rather than lenses. Moreover generating sufficient...

RF Metrology for High-Frequency Transistor Models

Ongoing

Due to the challenges of high-frequency measurements, that includes inaccuracy in on-wafer calibration and a lack of instrumentation for transistor characterization, models are currently extracted from low frequency measurements and extrapolated to higher frequencies. This methodology has been shown...

Metrology for Integration of New Magnetic Materials

Ongoing

Integration of magnetic materials remains a key challenge facing advanced packaging technologies. High power applications require voltage conversion at or near the die, and most practical power converters rely on inductors. Beyond power electronics, integration of magnetic components such as...

Metrology of Materials, Surfaces, and Processes for Hybrid Advanced Packaging

Ongoing

The most important part of any bonding process is getting the surfaces to stick. While the physical properties of the films, surfaces, and interfaces in conjunction with the bonding process parameters (pressure, duration, temperature, and post bond anneal) all play important roles, altering the...

Light Sources for Atom Probe Tomography illustration

Metrology with Novel Light Sources

Ongoing

Light Sources for Atom Probe Tomography In this project we develop and test different pulsed light sources for atom probe tomography (APT). These light sources vary in photon energy from the visible to the extreme ultraviolet range of the spectrum (3.5 eV to 40 eV); thus, triggering different...

Metrology of Purity and Contaminants in Solid Materials

Ongoing

Purity evaluations of high-purity bulk materials used in chips manufacturing are calibrated against reference materials that are often not matrix-matched to the materials under test. In other words, differences in the compositions of the calibrants and the samples being analyzed can result in large...

A micromechanical bulk acoustic resonator that uses phononic crystal tethers to achieve a quality factor approaching the fundamental dissipation limit (fxQ can be as large as 1.2 x 1013 Hz)

Micro- and Nanoelectromechanical Systems

Completed

MEMS/NEMS are enabling technologies that bring new functionalities with the potential to radically transform markets ranging from consumer products to national defense. The meteoric rise of the smartphone is an excellent example, in which MEMS accelerometers, gyroscopes, microphones, displays, and...

Molecular Dynamics Simulation of Heat Transport in Gate-All-Around Transistors

Ongoing

Thermal efficiency of semiconductor devices is pivotal to their operation and performance, especially now that the dimensions of transistor features are rapidly shrinking to the nanoscale. A significant knowledge gap persists in accurately describing and quantifying heat dissipation at such scales...

Multiscale Modeling and Validation of Semiconductor Materials and Devices

Ongoing

The limitations of scaling traditional CMOS (complementary metal-oxide semiconductors) designs have necessitated that the semiconductor industry consider new materials and design concepts. For wide bandgap semiconductor devices, optimization of materials and fabrication processes is needed to...

Nanocalorimetry

Completed

The global market for semiconductor chips is $270 billion. Growth in this industry is driven by the need to enhance performance by packing more transistors into the same chip area, with a relationship between feature size and time that approximately follows Moore's Law. As the feature size shrinks...

Nanocalorimetry Measurements

Ongoing

Accurate thermodynamic measurements are essential to understand fundamental properties of materials, providing direct and quantifiable insight into the thermodynamics of thin film reactions and phase transitions. Going forward, new classes of materials may only be synthesized as thin films, a scale...

Nanocalorimetry for Semiconductors and Semiconductor Process Metrology

Ongoing

In September 2022, NIST published a report titled Strategic Opportunities for U.S. Semiconductor Manufacturing , which cited, among other challenges, the need to understand and improve heat dissipation and performance in advanced microelectronics. Specifically, there needs to be better measurements...

Nanoelectromagnetics

Ongoing

The primary goal of this program is metrology that enables advanced nanoscale device (including electronics, spintronics, and life science) development. Based on current trends in electronics, we are focusing on metrology for two classes of devices: (1) nanoscale devices utilizing and exploring new...

Nanometrology: Composition and Structure of Nanomaterials

Ongoing

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry Nanoscale Analysis of Biological and Organic Materials Release from Nanocomposite Consumer Products

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