METIS

Description

BETA VERSION LAUNCHED

On September 26, 2024, CHIPS for America released a beta version of the Metrology Exchange to Innovate in Semiconductors (METIS). A major milestone for the CHIPS Metrology Program, METIS will give stakeholders access to CHIPS Metrology research results and serve to catalyze innovative breakthroughs in U.S. semiconductor manufacturing.  

The beta version includes initial data from three CHIPS Metrology Projects:  

• High Speed Metrology for Magnetoelectronic Devices and Models 
• Multiscale Modeling and Validation of Semiconductor Materials and Devices  
• CalNet

CHIPS for America has funded over $190 million across over 40 projects helping to develop new measurement instruments, measurement methods, and measurement-informed models and simulations for advanced microelectronics design and manufacturing.  

Once fully deployed, METIS will make available research and data from all CHIPS Metrology projects.  

The Metrology Exchange to Innovate in Semiconductors—METIS—is named after Metis, the Greek goddess of innovative ideas, good counsel, skill, and craft.

Credit: Adobe Stock

On December 14, 2023, CHIPS for America released “Building a Metrology Exchange to Innovate in Semiconductors (METIS)” for public comment. The

 publication describes a data-sharing platform, or data exchange, to ensure that the direct results of federally-funded scientific research under the CHIPS Metrology Program are made available to the public, industry, and the scientific community. 

The publication was open from December 2023 to February 2024 for public comments, to allow for a diversity of people to contribute their viewpoints and to ensure that stakeholders could provide critical feedback to shape the final paper outlining the vision for this data exchange. NIST received numerous comments, which will inform the final paper outlining the vision for this data exchange. 

What is METIS? 

The Metrology Exchange to Innovate in Semiconductors, or METIS, is a data exchange ecosystem developed by NIST that will give stakeholders access to CHIPS Metrology research results and serve to catalyze innovative breakthroughs in U.S. semiconductor manufacturing. 

To be successful, a data plan must be adopted by the communities it serves. Sharing and exchanging data, models, and other data products allows for world-leading microelectronics research to be transferred to the marketplace, enabling and supporting U.S. security and commercial competitiveness.

METIS will make research and data available in a manner that guards intellectual property, protects U.S. security interests, is aligned with the approach used by NIST for access to research results, and is self-sustaining to meet future needs. 

A broad group of primary stakeholders will benefit from METIS including microelectronic suppliers, manufacturers, product developers, and system engineers in academia and industry who design, fabricate, and test semiconductors, associated component parts, and their supply chains.