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William Alexander Osborn

Research Interests

  • Developing experimental techniques and reference standards for nano-scale strain measurement.
  • Evaluating the mechanical properties of MEMS scale devices through the development of testable devices, theoretical models, and accurate measurements.
  • Microfabrication of non-traditional devices to enable research in the areas of strain measurement and mechanical property evaluation.
  • Instrument design, building, and development.

Publications

Strain Measurement of 3D Structured Nanodevices by EBSD

Author(s)
William A. Osborn, Lawrence H. Friedman, Mark D. Vaudin
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions
Created October 9, 2019