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Yuri Ralchenko

Yuri Ralchenko is Group Leader of the Atomic Spectroscopy Group at NIST. His research is focused on spectroscopy of highly-charged ions, analysis of various atomic processes in plasmas with emphasis on accurate modeling of plasma population kinetics, development of Internet atomic databases, and other aspects of plasma spectroscopy. This work includes collisional-radiative modeling of various plasmas (including non-Maxwellian and transient ones), production and assessment of accurate atomic data (energies, oscillator strengths, collisional cross sections, etc.), and development of methods and standards for dissemination of scientific data.

Dr. Ralchenko is a Fellow of the American Physical Society. He was also awarded the 2015 NIST Judson C. French Award for "establishing the world's premier resource for atomic reference data, relied upon for everything from nuclear forensics to Hubble Space Telescope data analysis." He is an Editorial Board member of several scientific journals, has authored over 110 scientific publications, and has been a speaker at numerous national and international conferences.

Publication List

Publications

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

Author(s)
Paul Szypryt, Galen C. O'Neil, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Douglas A. Bennett, William B. Doriese, Malcolm S. Durkin, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Yuri Ralchenko
We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at

On Low-Energy Tail Distortions in the Detector Response Function of X-Ray Microcalorimeter Spectrometers

Author(s)
Galen C. O'Neil, Paul Szypryt, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Young I. Joe, Daniel S. Swetz, Daniel R. Schmidt, William B. Doriese, Johnathon D. Gard, Carl D. Reintsema, Joel N. Ullom, John S. Villarrubia, Yuri Ralchenko
We use narrow spectral lines from the X-ray spectra of various highly charged ions to measure low-energy tail-like deviations from a Gaussian response function
Created March 16, 2019, Updated December 11, 2019