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METIS: METROLOGY EXCHANGE TO INNOVATE IN SEMICONDUCTORS beta
What is METIS?
The Metrology Exchange to Innovate in Semiconductors, or METIS, is a data exchange ecosystem developed by NIST that will give stakeholders access to CHIPS Metrology research results and serve to catalyze innovative breakthroughs in U.S. semiconductor manufacturing.
Data Discovery
Products
Semantic Assets
Data Governance
Developer Tools
Contributing Data
Expanding the METIS Ecosystem
Learn more about instructions and tools on how to share your innovations.
Recently Released Products
Check out the resources NIST has to offer in these areas. And make sure to come back next month to check out resources in other collections.
High Speed Metrology for Magnetoelectronic Devices and Models
Multiscale Modeling and Validation of Semiconductor Materials and Devices
CalNet
