What is METIS?

The Metrology Exchange to Innovate in Semiconductors, or METIS, is a data exchange ecosystem developed by NIST that will give stakeholders access to CHIPS Metrology research results and serve to catalyze innovative breakthroughs in U.S. semiconductor manufacturing.

To be successful, a data plan must be adopted by the communities it serves. Sharing and exchanging data, models, and other data products allows for world-leading microelectronics research to be transferred to the marketplace, enabling and supporting U.S. security and commercial competitiveness.

METIS will make research and data available in a manner that guards intellectual property, protects U.S. security interests, is aligned with the approach used by NIST for access to research results, and is self-sustaining to meet future needs.

A broad group of primary stakeholders will benefit from METIS including microelectronic suppliers, manufacturers, product developers, and system engineers in academia and industry who design, fabricate, and test semiconductors, associated component parts, and their supply chains.