Getting Started

METIS is a rich ecosystem designed for dissemination and exchange of digital products, developed by the CHIPS R&D Metrology program, along with technical partnerships and collaborations. The METIS White Paper and Community Response outlined a vision and set of goals which we are charting a course to achieve.

METIS content will be continuously updated along with new resources and capabilities. METIS will actively engage with the CHIPS R&D community as well as digital technology partners to enhance and promote innovative ideas and utilization of digital products.  FAIR Data Systems, which are secure and trustworthy, provide overarching concepts for the METIS framework.

We look forward to working together and engaging with others in this exciting digital journey. We appreciate your patience and feedback as we enhance METIS in support of the CHIPS R&D community.

Explore what METIS has to offer. For Quick Access to data, click on the Data Discovery portal or one of the Featured Datasets which are derived from the CHIPS Metrology research program.

Data Discovery

Products

Semantic Assets

 

Data Governance

Developer Tools

Contributing Data

With this beta release, all data resources are publicly accessible through the provided access URLs or via the Data Access Files direct downloads. 

Additional Information 

This site provides a central location for users to find featured new data releases and learn more about METIS operation and engagement. The governance of METIS follows federal policy, NIST directives, and CHIPS R&D guidance. The beta release supports public access to CHIPS Metrology. 

METIS provides a suite of resources which enable discovery and access to the NIST CHIPS Metrology products generated through several programmatic areas for semiconductor and microelectronics research. Each digital product is assigned a Digital Object Identifier (DOI) for reference and citation. The METIS white paper and response to Community inputs are published here.