David LaVan is a Project Leader in the Materials Measurement Science Division within the Material Measurement Laboratory at the National Institute of Standards and Technology (NIST). He works on the development of new MEMS based thermal sensors for materials characterization including high speed and high throughput approaches and integration of the nanocalorimeters into electron microscopes and mass spectrometers. He was selected for the U.S. National Academy of Engineering Frontiers of Engineering in 2006 and Keck Futures Initiatives in 2009 on Synthetic Biology and in 2004 on Nanostructures. He received his B.S. in Materials Science and Engineering from the University of Florida and his Ph.D. from The Johns Hopkins University. He was a post-doctoral fellow at Sandia National Labs, a research affiliate/associate in the MIT-Harvard Health Sciences & Technology program and an assistant professor at Yale University.