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The Oxford FlexAL atomic layer deposition (ALD) system supports plasma and thermal ALD coating processes with precise ultrathin and pinhole free films. The
The Denton Vacuum Discovery 550 sputtering system has two direct current (DC) and two radio frequency (RF) sputtering guns which bombard targets, causing atoms
The Denton Vacuum Discovery 550 sputtering system has two direct current (DC) and two radio frequency (RF) sputtering guns which bombard targets, causing atoms
The Denton Vacuum Infinity 22 electron beam evaporator vapor deposits thin films and is capable of loading up to six source materials for deposition. The
The Denton Vacuum Infinity 22 dual source evaporator uses a choice of either electron beam evaporation or resistive heating to vapor deposit thin films
Whip together an industrial waste product and a bit of plastic and you might have the recipe for the next revolution in battery technology. Scientists from the...
What sounds like fixings for a wizard's potion—a dash of clay, a dab of fiber from crab shells, and a dollop of DNA—actually are the ingredients of promising...
Who is that stranger in your social media photo? A click on the face reveals the name in seconds, almost as soon as you can identify your best friend. While...
This apparatus, developed at EL, has been constructed to generate a controlled and repeatable size and mass distribution of glowing firebrands. The purpose of
The National Institute of Standards and Technology (NIST) has published a second public draft of Supply Chain Risk Management Practices for Federal Information...
Rodney Brooks, founder, chairman and chief technology officer of Rethink Robotics, Inc., has joined the Visiting Committee on Advanced Technology (VCAT), the...
On May 29, the President's Council of Advisors on Science and Technology (PCAST) released a report to President Obama, Better Health Care and Lower Costs...
On May 29, 2014, at the White House Healthy Kids and Safe Sports Concussion Summit, President Obama highlighted both the need for greater national awareness of...
Quantum information can't break the cosmic speed limit, according to researchers from the National Institute of Standards and Technology (NIST) and the...
The National Institute of Standards and Technology (NIST) has requested public comments on its newly proposed "Secure Hash Algorithm-3" (SHA-3) Standard, which...
The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. This...
Secretary of Commerce Penny Pritzker recently appointed four new members to the Panel of Judges for the Malcolm Baldrige National Quality Award. The new judges...
In order to enable studies of a range of indoor air quality and ventilation issues, EL maintains a highly instrumented three-bedroom test house. Previous
The Bruker Dektak 6M contact profilometer measures the thickness of patterned thin films by sensing the deflections of a fine stylus riding over feature steps
The J. A. Woollam M-2000 DI spectroscopic ellipsometer provides fast and accurate thin film characterization over a wide spectroscopic range. The high speed CCD
The First Ten Angstroms FTA125 is a general purpose goniometer that can measure the contact angle and surface tension of liquid droplets on a substrate's
The Nikon SMZ1500 is a long working distance stereo microscope that supports both reflected light and transmitted light modes for inspecting substrates and
The Nikon L200 is a compound optical microscope that supports both reflected light and transmitted light modes for inspecting substrates and samples. The
The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster
Angela Hight Walker of PML's Semiconductor and Dimensional Metrology Division and colleagues have succeeded in measuring a previously unknown but essential...