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Search Publications by: Benjamin Caplins (Fed)

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Displaying 1 - 20 of 20

Results of an Interlaboratory Study on the Working Curve in Vat Photopolymerization

March 18, 2024
Author(s)
Thomas Kolibaba, Jason Killgore, Benjamin Caplins, Callie Higgins, Uwe Arp, C Cameron Miller, Yuqin Zong
The working curve informs resin properties and print parameters for stereolithography, digital light processing, and other photopolymer additive manufacturing (PAM) technologies. First demonstrated in 1992, the working curve measurement of cure depth vs

Atom Probe Tomography Using an Extreme Ultraviolet Trigger Pulse

September 1, 2023
Author(s)
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an

A Data-Driven Approach to Complex Voxel Predictions in Grayscale Digital Light Processing Additive Manufacturing Using U-nets and Generative Adversarial Networks

July 6, 2023
Author(s)
Jason Killgore, Thomas Kolibaba, Benjamin Caplins, Callie Higgins, Jake Rezac
Machine learning models such as U-nets like the pix2pix conditional generative adversarial network (cGAN) are shown to predict 3D printed voxel geometry in digital light processing (DLP) additive manufacturing. The models are trained on microscopic voxel

Characterizing light engine uniformity and its influence on LCD-based vat photopolymerization printing

December 27, 2022
Author(s)
Benjamin Caplins, Callie Higgins, Thomas Kolibaba, Uwe Arp, C Cameron Miller, Dianne L. Poster, Clarence Zarobila, Yuqin Zong, Jason Killgore
Vat photopolymerization (VP) is a rapidly growing category of additive manufacturing. As VP methods mature the expectation is that the quality of printed parts will be highly reproducible. At present, detailed characterization of the light engines used in

Orientation Mapping of Graphene Using 4D STEM-in-SEM

October 13, 2020
Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction

An Algorithm for Correcting Systematic Energy Deficits in the Atom Probe Mass Spectra of Insulating Samples

April 15, 2020
Author(s)
Benjamin W. Caplins, Paul T. Blanchard, Ann C. Chiaramonti Debay, David R. Diercks, Luis Miaja Avila, Norman A. Sanford
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating

Atom Probe Tomography using Extreme-Ultraviolet Light

March 27, 2020
Author(s)
Luis Miaja Avila, Ann C. Chiaramonti Debay, Benjamin W. Caplins, David R. Diercks, Brian Gorman, Norman A. Sanford
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger eld ion emission at the tip's apex. The use of

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
This paper reports construction of an extreme ultraviolet (EUV) radiation-triggered atom probe tomograph and describes the results from initial experiments on amorphous SiO2. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

May 1, 2019
Author(s)
Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of

Transmission Imaging with a Programmable Detector in a Scanning Electron Microscope

September 13, 2018
Author(s)
Benjamin W. Caplins, Jason D. Holm, Robert R. Keller
A new type of angularly selective electron detector for use in a scanning electron microscope is presented. The detector leverages a digital micromirror device (DMD) to take advantage of the benefits of two-dimensional (2D) imaging detectors and high