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Search Publications by Benjamin Caplins

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Displaying 1 - 16 of 16

Orientation Mapping of Graphene Using 4D STEM-in-SEM

Author(s)
Benjamin W. Caplins, Jason D. Holm, Ryan M. White, Robert R. Keller
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning

Atom Probe Tomography using Extreme-Ultraviolet Light

Author(s)
Luis Miaja Avila, Ann C. Chiaramonti Debay, Benjamin W. Caplins, David R. Diercks, Brian Gorman, Norman A. Sanford
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an