Caplins, B.
, Holm, J.
and Keller, R.
(2019),
A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope, Proceedings of SPIE Photonics West 2019, San Francisco, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927331
(Accessed October 9, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope
Published
Author(s)
, ,
Abstract
Unit cell orientation information is encoded in electron diffraction patterns of crystalline materials. Traditional transmission electron detectors implemented in the scanning electron microscope are highly symmetric and are insensitive to in-plane unit cell orientation information. Herein we detail the implementation of a transmission electron detector that utilizes a digital micromirror array to select anisotropic portions of a diffraction pattern for imaging purposes. We demonstrate that this detector can be used to map the in-plane orientation of grains in two-dimensional materials. The described detector has the potential to replace and/or supplement conventional transmission electron detectors.Proceedings Title
Proceedings of SPIE Photonics West 2019
Conference Dates
February 2-7, 2019
Conference Location
San Francisco, CA
Conference Title
SPIE Photonics West 2019
Pub Type
Conferences
Download Paper
Keywords
digital micromirror device (DMD), scanning electron microscope (SEM), scanning transmission electron microscopy (STEM), transmission electron detector
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created February 7, 2019, Updated April 11, 2019