Holm, J.
, Caplins, B.
and Keller, R.
(2019),
A Programmable Transmission Electron Detector for Nanomaterials Characterization in a Scanning Electron Microscope, TechConnect World Technical Proceedings, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927907
(Accessed September 15, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Programmable Transmission Electron Detector for Nanomaterials Characterization in a Scanning Electron Microscope
Published
Author(s)
, ,
Abstract
A new programmable detector for scanning transmission electron microscopy (pSTEM) is described. A digital micromirror array lies at the heart of the detector and serves as a programmable virtual objective aperture. Two sensors, a photomultiplier tube and a CMOS digital camera are used to enable real-space transmission imaging and on-axis diffraction, respectively. Detector operation is demonstrated with several samples in a conventional scanning electron microscope (SEM).Citation
TechConnect World Technical Proceedings
Volume
TechConnect Briefs 2019
Pub Type
Journals
Download Paper
Keywords
scanning, transmission, electron microscopy, diffraction, programmable
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 17, 2019, Updated August 28, 2019