NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

Published

Author(s)

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

Abstract

A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of view up to ~50 um in just a few minutes and can distinguish twisted bilayers from aligned bilayers. This method holds promise to bring electron diffraction based orientation measurements of 2D materials to a broader audience.
Citation
Carbon
Volume
149
Pub Type
Journals

Download Paper

Local Download
Materials characterization and Nanomaterials

Citation

Caplins, B. , Holm, J. and Keller, R. (2019), Grain Orientation Mapping of Graphene in a Scanning Electron Microscope, Carbon, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926839 (Accessed October 21, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 1, 2019, Updated May 9, 2019
Was this page helpful?