Skip to main content
U.S. flag

An official website of the United States government

Dot gov

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Https

Secure .gov websites use HTTPS
A lock ( ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Grain Orientation Mapping of Graphene in a Scanning Electron Microscope

Published

Author(s)

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

Abstract

A scanning transmission electron diffraction method is developed for use in the scanning electron microscope to perform orientational imaging microscopy of 2D materials. The method can generate grain orientational maps of monolayer graphene over a field of view up to ~50 um in just a few minutes and can distinguish twisted bilayers from aligned bilayers. This method holds promise to bring electron diffraction based orientation measurements of 2D materials to a broader audience.
Citation
Carbon
Volume
149

Citation

Caplins, B. , Holm, J. and Keller, R. (2019), Grain Orientation Mapping of Graphene in a Scanning Electron Microscope, Carbon, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926839 (Accessed April 11, 2021)
Created May 1, 2019, Updated May 9, 2019