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Search Publications by: Jeffrey Jargon (Fed)

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Displaying 26 - 50 of 120

3.5 GHz Radar Waveform Capture at Fort Story

August 4, 2017
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Peter J. Jeavons, Michael R. Souryal, Adam J. Wunderlich, Mark Lofquist
We describe measurements to create a library of high-fidelity waveforms of federal incumbent radar signals currently operating in the 3550 MHz – 3650 MHz (“3.5 GHz”) band. In this second phase of assembling the library, measurements were collected at Fort

Measurement Challenges for 5G and Beyond

July 14, 2017
Author(s)
Catherine A. Remley, Jeffrey A. Jargon, Joshua A. Gordon, Alexandra E. Curtin, David R. Novotny, Christopher L. Holloway, Robert D. Horansky, Michael S. Allman, Jeanne T. Quimby, Camillo A. Gentile, Peter B. Papazian, Ruoyu Sun, Damir Senic, Jelena Senic, Matthew T. Simons, Maria G. Becker, Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Ari D. Feldman, Paul D. Hale, Mohit S. Mujumdar, Nada T. Golmie
National Metrology Institutes (NMIs) around the world are charged with supporting industry through improved measurement science and by providing a traceability path to fundamental physical standards. Mobile wireless communications have become a ubiquitous

Channel Sounder Measurement Verification and Uncertainty

June 2, 2017
Author(s)
Catherine A. Remley, Jeanne T. Quimby, Paul D. Hale, Dylan F. Williams, Jeffrey A. Jargon, Rodney W. Leonhardt
This presentation describes channel-sounder measurement verification procedures including options such as comparing measurements to theory, conducted tests of a known, simulated-channel artifact, direct over-the-air comparison to a vector network analyzer

3.5 GHz Radar Waveform Capture at Point Loma

May 11, 2017
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Peter J. Jeavons, Michael R. Souryal, Adam J. Wunderlich, Mark Lofquist
We describe measurements to create a library of high-fidelity waveforms of federal incumbent radar signals currently operating in the 3550 MHz – 3650 MHz (“3.5 GHz”) band. In the first phase of assembling this library, measurements were collected at Point

Calibration of Time-interleaved Errors in Real-time Digital Oscilloscopes

November 1, 2016
Author(s)
Jeffrey A. Jargon, Chihyun Cho, Joo-Gwang Lee, Paul D. Hale, Peter J. Jeavons, John B. Schlager, Andrew M. Dienstfrey
A novel method is proposed for the calibration of channel mismatch in a time-interleaved real- time digital oscilloscope (RTDO). A simple simultaneous equation is derived from the Fourier transform of the time-interleaved signals requiring only a transfer

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

June 1, 2015
Author(s)
Gustavo Avolio, Antonio Raffo, Jeffrey Jargon, Dominique Schreurs, Dylan Williams
This work focuses on the accuracy of nonlinear de-embedding applied to microwave transistor time-domain waveforms. The waveforms are acquired with a mixer-based Large-Signal Network Analyzer (LSNA) and are corrected at the transistor's reference planes by

Calibration of channel mismatch in time-interleaved real-time digital oscilloscopes

May 22, 2015
Author(s)
Jeffrey A. Jargon, Paul D. Hale, Peter J. Jeavons, John B. Schlager, Andrew M. Dienstfrey, Joo-Gwang Lee, Chihyun Cho
A novel method is proposed for the calibration of channel mismatch in a time-interleaved real- time digital oscilloscope (RTDO). The method only requires a transfer function of time- interleaved ADCs (TIADCs), and also proposes measurement schemes of the

Rectangular-Waveguide Impedance

May 22, 2015
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Uwe Arz, Paul D. Hale
We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We also

Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty

May 1, 2015
Author(s)
Catherine A. Remley, Dylan F. Williams, Paul D. Hale, Chih-Ming Wang, Jeffrey A. Jargon, Youngcheol Park
We provide techniques to generate and characterize precision wideband millimeter-wave modulated signals. We use predistortion to obtain a significant improvement in signal quality and an associated reduction in the error vector magnitude (EVM) of the

A Compact Millimeter-wave Multisine Generator for Calibrating Broadband Vector Receivers

April 30, 2015
Author(s)
Paul D. Hale, Kate Remley, Dylan Williams, Jeffrey Jargon, Chih-Ming Wang
We propose a compact and low cost waveform source that can be used to calibrate the magnitude and phase response of vector receivers over a bandwidth as large as a few gigahertz. The generator consists of a broadband comb generator followed by a filter and

Photonic-assisted Endoscopic Analysis of W-band Waveguide

October 12, 2014
Author(s)
Jeffrey A. Jargon, DongJoon Lee, JaeYong Kwon, YoungPyo Hong
We demonstrate an endoscopic probing system to measure field distribution through a W-band waveguide. The electric fields propagating inside a WR-10 waveguide are measured utilizing W-band harmonics of a femtosecond laser with a minute photonic probe.

Photonic-assisted Endoscopic Analysis of Guided W-band Pulses

August 24, 2014
Author(s)
Jeffrey A. Jargon, DongJoon Lee, JaeYong Kwon
We present a photonic-assisted time-domain measurement technique for exploring millimeter-wave propagation through a W-band waveguide. The electric fields, guided inside a rectangular waveguide, are sampled using a sub-millimeter-scale electro-optic probe

Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework

June 6, 2014
Author(s)
Jeffrey A. Jargon, Dylan F. Williams, Paul D. Hale, Michael D. Janezic
We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform

October 1, 2012
Author(s)
Chih-Ming Wang, Paul D. Hale, Jeffrey A. Jargon, Dylan F. Williams, Catherine A. Remley
We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the information in

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

July 6, 2012
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any