Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

Published

June 1, 2015

Author(s)

Gustavo Avolio, Antonio Raffo, Jeffrey Jargon, Dominique Schreurs, Dylan Williams

Abstract

This work focuses on the accuracy of nonlinear de-embedding applied to microwave transistor time-domain waveforms. The waveforms are acquired with a mixer-based Large-Signal Network Analyzer (LSNA) and are corrected at the transistor's reference planes by accounting for the residual uncertainty in the calibration procedure. This uncertainty is first mapped into the measured time-domain waveforms and then further propagated to the time-domain waveforms and impedances at the transistor current-generator plane through a nonlinear deembedding procedure.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

63

Issue

7

Pub Type

Journals

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Keywords

Deembedding, microwave transistors, microwave measurement uncertainty, vector-calibrated nonlinear measurements

Citation

Avolio, G. , Raffo, A. , Jargon, J. , Schreurs, D. and Williams, D. (2015), Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916501 (Accessed October 17, 2025)