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PUBLICATIONS

Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework

Published

Author(s)

Jeffrey A. Jargon, Dylan F. Williams, Paul D. Hale, Michael D. Janezic

Abstract

We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-to-waveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator, and a waveguide taper. With the aforementioned directional components, the well-known adapter removal technique is not adequate for characterizing our device. In this paper, we describe and implement our method, and propagate the uncertainties from the two required calibrations to the characterized device.
Proceedings Title
ARFTG 83rd Microwave Measurement Conference
Conference Dates
June 6, 2014
Conference Location
Tampa Bay, FL
Pub Type
Conferences

Keywords

Characterize, coaxial, directional, noninsertable, rectangular waveguide, uncertainty, vector network analyzer
Optoelectronics and Metrology

Citation

Jargon, J. , Williams, D. , Hale, P. and Janezic, M. (2014), Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework, ARFTG 83rd Microwave Measurement Conference, Tampa Bay, FL (Accessed September 7, 2024)

Issues

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Created June 6, 2014, Updated February 19, 2017