Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty

Published

Author(s)

Catherine A. Remley, Dylan F. Williams, Paul D. Hale, Chih-Ming Wang, Jeffrey A. Jargon, Youngcheol Park

Abstract

We provide techniques to generate and characterize precision wideband millimeter-wave modulated signals. We use predistortion to obtain a significant improvement in signal quality and an associated reduction in the error vector magnitude (EVM) of the signals generated by an arbitrary-waveform-generator-based source. We adapt a recently developed microwave uncertainty framework to the problem and use it to estimate the uncertainties in the modulated-signal measurements. Models of uncertainties related to all calibration and measurement procedures within the traceability path are included in a sensitivity analysis and Monte Carlo simulations that maintain correlations between time-and frequency-domain errors. We demonstrate EVM values of approximately 1.6% +/- 0.5% for a 1-GSymbol/s 64-state quadrature-amplitude-modulated signal at 44 GHz.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
63
Issue
5

Keywords

Digitally modulated signal, error vector magnitude (EVM), measurement uncertainty, microwave measurement, millimeter-wave wireless communications, oscilloscope, wireless system

Citation

Remley, C. , Williams, D. , Hale, P. , Wang, C. , Jargon, J. and Park, Y. (2015), Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2015.2416180 (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 1, 2015, Updated January 27, 2020