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The Impact of Characteristic Impedance on Waveform Calibrations



Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale


We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of coplanar lines can lead to statistically significant errors in the calibrations in both the time and frequency domains.
Proceedings Title
Proc. 2013 International Microwave Symposium
Conference Dates
June 2-7, 2013
Conference Location
Seattle, WA


Characteristic impedance, coplanar waveguide, electro-optic sampling, mismatch correction, on-wafer measurement, temporal waveform measurement


Williams, D. , Jargon, J. and Hale, P. (2013), The Impact of Characteristic Impedance on Waveform Calibrations, Proc. 2013 International Microwave Symposium, Seattle, WA (Accessed June 9, 2023)
Created June 7, 2013, Updated February 19, 2017