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PUBLICATIONS

The Impact of Characteristic Impedance on Waveform Calibrations

Published

Author(s)

Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale

Abstract

We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of coplanar lines can lead to statistically significant errors in the calibrations in both the time and frequency domains.
Proceedings Title
Proc. 2013 International Microwave Symposium
Conference Dates
June 2-7, 2013
Conference Location
Seattle, WA
Pub Type
Conferences

Keywords

Characteristic impedance, coplanar waveguide, electro-optic sampling, mismatch correction, on-wafer measurement, temporal waveform measurement
Semiconductors

Citation

Williams, D. , Jargon, J. and Hale, P. (2013), The Impact of Characteristic Impedance on Waveform Calibrations, Proc. 2013 International Microwave Symposium, Seattle, WA (Accessed October 15, 2025)

Issues

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Created June 7, 2013, Updated February 19, 2017
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