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Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources

Published

Author(s)

Catherine A. Remley, Dylan F. Williams, Paul D. Hale, Chih-Ming Wang, Jeffrey A. Jargon, Youngcheol Park

Abstract

We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency components in a measured modulated signal are maintained by use of a calibrated equivalent-time sampling oscilloscope. The nonidealities of the oscilloscope and other components of the measurement system are corrected during post processing. Determination of the uncertainties in the measurement allows a user to identify distortion introduced by the source separately from that of the receiver.
Conference Dates
April 2-4, 2014
Conference Location
Leuven
Conference Title
The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits

Keywords

Digitally modulated signals, nonlinear measurements, oscilloscope, wireless system

Citation

Remley, C. , Williams, D. , Hale, P. , Wang, C. , Jargon, J. and Park, Y. (2014), Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources, The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits, Leuven, -1 (Accessed July 24, 2024)

Issues

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Created April 4, 2014, Updated January 27, 2020