Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources

Published

April 4, 2014

Author(s)

Catherine A. Remley, Dylan F. Williams, Paul D. Hale, Chih-Ming Wang, Jeffrey A. Jargon, Youngcheol Park

Abstract

We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency components in a measured modulated signal are maintained by use of a calibrated equivalent-time sampling oscilloscope. The nonidealities of the oscilloscope and other components of the measurement system are corrected during post processing. Determination of the uncertainties in the measurement allows a user to identify distortion introduced by the source separately from that of the receiver.

Conference Dates

April 2-4, 2014

Conference Location

Leuven

Conference Title

The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits

Pub Type

Conferences

Keywords

Digitally modulated signals, nonlinear measurements, oscilloscope, wireless system

Citation

Remley, C. , Williams, D. , Hale, P. , Wang, C. , Jargon, J. and Park, Y. (2014), Calibrated Oscilloscope Measurements for System-Level Characterization of Weakly Nonlinear Sources, The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits, Leuven, -1 (Accessed October 9, 2025)