Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework

Published

November 30, 2012

Author(s)

Jeffrey A. Jargon, Uwe Arz, Dylan F. Williams

Abstract

We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists of a two-tier approach, where a vector network analyzer (VNA) calibration is first performed in rectangular waveguide, and then a second-tier calibration is performed on-wafer. The second method determines the scattering parameters of the probes from two one-tier calibrations. We show that the two methods yield nearly equivalent results and uncertainties.

Proceedings Title

ARFTG 80th Microwave Measurement Conference

Conference Dates

November 28-30, 2012

Conference Location

San Diego, CA

Pub Type

Conferences

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Keywords

characterize, compare, coplanar waveguide, probe, rectangular waveguide, uncertainty, network analyzer

Citation

Jargon, J. , Arz, U. and Williams, D. (2012), Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework, ARFTG 80th Microwave Measurement Conference, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912557 (Accessed October 15, 2025)