Jargon, J.
, Arz, U.
and Williams, D.
(2012),
Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework, ARFTG 80th Microwave Measurement Conference, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912557
(Accessed April 25, 2024)
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Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework
Published
Author(s)
, Uwe Arz,
Abstract
We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists of a two-tier approach, where a vector network analyzer (VNA) calibration is first performed in rectangular waveguide, and then a second-tier calibration is performed on-wafer. The second method determines the scattering parameters of the probes from two one-tier calibrations. We show that the two methods yield nearly equivalent results and uncertainties.Proceedings Title
ARFTG 80th Microwave Measurement Conference
Conference Dates
November 28-30, 2012
Conference Location
San Diego, CA
Pub Type
Conferences
Download Paper
Keywords
characterize, compare, coplanar waveguide, probe, rectangular waveguide, uncertainty, network analyzer
Citation
Created November 30, 2012, Updated December 12, 2017