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Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework

Published

Author(s)

Jeffrey A. Jargon, Uwe Arz, Dylan F. Williams

Abstract

We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framework. The first method consists of a two-tier approach, where a vector network analyzer (VNA) calibration is first performed in rectangular waveguide, and then a second-tier calibration is performed on-wafer. The second method determines the scattering parameters of the probes from two one-tier calibrations. We show that the two methods yield nearly equivalent results and uncertainties.
Proceedings Title
ARFTG 80th Microwave Measurement Conference
Conference Dates
November 28-30, 2012
Conference Location
San Diego, CA

Keywords

characterize, compare, coplanar waveguide, probe, rectangular waveguide, uncertainty, network analyzer

Citation

Jargon, J. , Arz, U. and Williams, D. (2012), Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework, ARFTG 80th Microwave Measurement Conference, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912557 (Accessed June 18, 2024)

Issues

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Created November 30, 2012, Updated December 12, 2017