Developing Models for Type N Coaxial VNA Calibration Kits within the NIST Microwave Uncertainty Framework

Published

May 26, 2016

Author(s)

Jeffrey Jargon, Dylan Williams, Paul D. Hale

Abstract

We developed models for Type N coaxial vector network analyzer (VNA) calibration kits within the NIST Microwave Uncertainty Framework. First, we created physical models of commercially- available standards that support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and included error mechanisms in each of the standards' constituent parameters that were utilized in the NIST Microwave Uncertainty Framework to propagate uncertainties. Next, we created a measurement-based model of a commercial electronic calibration unit (ECU) by characterizing the scattering parameters of its internal states with a multiline TRL calibration. Finally, we calibrated a network analyzer using the three calibration methods, and compared measurements and uncertainties made on a number of verification devices. We showed that the three calibrations agreed to within their respective uncertainties.

Proceedings Title

87th ARFTG

Conference Dates

May 27, 2016

Conference Location

San Francisco, CA, US

Pub Type

Conferences

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Keywords

calibration, coaxial, electronic calibration unit, physical models, uncertainty, vector network analyzer, verification

Citation

Jargon, J. , Williams, D. and Hale, P. (2016), Developing Models for Type N Coaxial VNA Calibration Kits within the NIST Microwave Uncertainty Framework, 87th ARFTG, San Francisco, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920292 (Accessed October 17, 2025)