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Quantifying Variance Components for Repeated Scattering-Parameter Measurements

Published

Author(s)

Amanda Koepke, Jeffrey Jargon

Abstract

We quantify random uncertainties for scattering-parameters repeatedly measured with a vector network analyzer (VNA), focusing on variations due to multiple calibrations, disconnects, and repeat measurements. We describe a two-stage nested design, which allows us to model the random effects, and present results for a series of coaxial measurements performed by making use of an open-short- load-thru (OSLT) calibration kit with Type-N connectors.
Conference Dates
November 28-December 1, 2017
Conference Location
Boulder, CO, US
Conference Title
90th ARFTG Microwave Measurement Symposium

Keywords

calibration, disconnect, measurement, repeat, scattering-parameters, two-stage nested design, variance

Citation

Koepke, A. and Jargon, J. (2017), Quantifying Variance Components for Repeated Scattering-Parameter Measurements, 90th ARFTG Microwave Measurement Symposium, Boulder, CO, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924538 (Accessed May 21, 2024)

Issues

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Created November 30, 2017, Updated April 12, 2022