October 1, 2001
      
                  
        
  Author(s)
  Zachary H. Levine,   A R. Kalukin,   M  Kuhn,   S P. Frigo,   I  McNulty,   C C. Retsch,   Y  Wang,   Uwe  Arp,   Thomas B. Lucatorto,   Bruce D. Ravel,   Charles S. Tarrio
 
       
            
    
    
        00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigration