Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Mass Absorption Coefficient of Tungsten for 1600-2100 eV



Zachary H. Levine, S Grantham, I McNulty


The transmission of soft x-rays with photon energies from 1606 eV to 2106 eV was measured for tungsten using thin film samples and a synchrotron source. This region includes the MIV and MV edges. The two tungsten films had thicknesses of 107.7 10 nm and 51.5 10 nm; the intensity of the transmitted x rays was measured with a silicon photodiode. The values for the mass absorption coefficient reported here were determined from the ratios of the transmission through the two samples, i.e., through a net 56.2 14 nm of tungsten, and some additional constant factors. The MV,IV edges have widths (10%-90% after backgroundsubtraction) of 33 5 eV and 28 5 eV, respectively, compared to zero width in all x-ray tables based on atomic form factors and 44 eV within a real-space multiple-scattering theory. The measurements are relevant to microspectroscopy and microtomography of integrated circuit interconnects and may be applicable to accurate measurement of the mass absorption coefficinets of similar dense elements.
Physical Review B (Condensed Matter and Materials Physics)
No. 6


M-sub-IV edge, M-sub-V edge, mass absorption coefficient, tungsten


Levine, Z. , Grantham, S. and McNulty, I. (2002), Mass Absorption Coefficient of Tungsten for 1600-2100 eV, Physical Review B (Condensed Matter and Materials Physics) (Accessed July 21, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created February 1, 2002, Updated February 17, 2017