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Search Publications by: David R Black (Fed)

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Displaying 26 - 50 of 111

Crystalline domain size and faulting in the new NIST SRM 1979 zinc oxide

September 6, 2013
Author(s)
James P. Cline, David R. Black, Albert Henins, John E. Bonevich, Whitfield S. Pam, Paolo Scardi, Matteo Leoni
A NIST SRM certified to address the issue of crystallite size measurement through a line profile analysis has been under development for several years. In order to prepare the feedstock for the SRM, nano-crystalline zinc oxide was produced from thermal

Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

August 6, 2012
Author(s)
David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline
Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Complementary Experimental Techniques for Multi-Scale Modeling of Plasticity

October 16, 2008
Author(s)
Lyle E. Levine, Gabrielle G. Long, David R. Black
Some recently-developed experimental techniques, such as in situ ultra-small-angle X-ray scattering (USAXS), have demonstrated a capability for measuring aspects of dislocation structure evolution that are inaccessible to other experimental methods

Investigation of Electron Hole Recombination-Activated Partial Dislocations and Their Behavior in 4H-SiC Epitaxial Layers

May 8, 2008
Author(s)
Yi Chen, Ning Zhang, M Dudley, JOSHUA CALDWELL, Kendrick Liu, ROBERT STAHLBUSH, XIANRONG HUANG, A T. Macrander, David R. Black
Electron hole recombination-activated partial dislocations in 4H silicon carbide homoepitaxial layers and their behavior have been studied using synchrotron X-ray topography and electroluminescence. Stacking faults whose expansion was activated by electron