Black, D.
and Quinn, G.
(2005),
Using X-ray topography to inspect surfaces of single-crystal components, International Journal of Applied Ceramic Technology (Accessed May 8, 2026)
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Using X-ray topography to inspect surfaces of single-crystal components
Published
Author(s)
,
Citation
International Journal of Applied Ceramic Technology
Volume
2
Issue
4
Pub Type
Journals
Citation
Issues
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Created September 1, 2005, Updated February 19, 2017