Black, D.
and Polvani, R.
(2000),
A Recommendation for an Inspection Standard to Control Sub-Surface Damage in Single-Crystal Sapphire Components, Sapphire Statistical Characterization and Risk Reduction Program
(Accessed December 14, 2024)
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A Recommendation for an Inspection Standard to Control Sub-Surface Damage in Single-Crystal Sapphire Components
Published
Author(s)
,
Abstract
A variety of characterization techniques have been investigated to study surface and subsurface damage in single-crystal sapphire. To characterize the damage in ground surfaces we found that dimpling was the most useful tool. Surfaces with damage intermediate between that of ground surfaces and optically polished (specular) surfaces need to be addressed on a case by case basis. For optically polished surfaces an inspection protocol has been established consisting of optical characterization by bright light inspection, optical microscopy and surface finish measurements and x ray inspection using diffraction topography. A correlation was found between the microstructure imaged in topographs from a series of MOR bars and their fracture strength. Residual damage from the fabrication process reduced the average strength of the bars by 30%.Citation
Sapphire Statistical Characterization and Risk Reduction Program
Pub Type
Journals
Keywords
microscopy, microstructure, sapphire, surface damage, surface finish, x-ray topography
Citation
Issues
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Created April 1, 2000, Updated October 17, 2019