Black, D.
, Woicik, J.
, Erdtmann, M.
and Currie, M.
(2006),
Imaging Defects in Strained Silicon Thin Films by X-ray Topography, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854299
(Accessed November 10, 2024)