Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components
David R. Black
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The attributes of x-ray topography as applied to inspection will be described and illustrated with examples from recent experiments.
International Journal of Applied Ceramic Technology