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PUBLICATIONS

Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components

Published

Author(s)

David R. Black

Abstract

X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The attributes of x-ray topography as applied to inspection will be described and illustrated with examples from recent experiments.
Citation
International Journal of Applied Ceramic Technology
Volume
2
Issue
No. 4
Pub Type
Journals

Keywords

damage, defects, surface structure, x-ray diffraction, x-ray topography

Citation

Black, D. (2005), Using X-Ray Topography to Inspect Surfaces of Single-Crystal Components, International Journal of Applied Ceramic Technology (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created July 1, 2005, Updated February 17, 2017
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