X-Ray Topography for Fractography of Single-Crystal Components
David R. Black, George D. Quinn
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of single-crystal samples both before and after fracture. It can find strength and performance limiting surface and subsurface flaws that are undetectable by other methods or are detectable only with great difficulty and provides a complementary view of the fracture surface. The attributes of synchrotron based x-ray topography as applied to fractography will be described and illustrated with examples from recent experiments on sapphire.