Black, D.
and Quinn, G.
(2006),
X-Ray Topography for Fractography of Single-Crystal Components, Journal of Failure Analysis and Prevention
(Accessed January 19, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
X-Ray Topography for Fractography of Single-Crystal Components
Published
Author(s)
,
Abstract
X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of single-crystal samples both before and after fracture. It can find strength and performance limiting surface and subsurface flaws that are undetectable by other methods or are detectable only with great difficulty and provides a complementary view of the fracture surface. The attributes of synchrotron based x-ray topography as applied to fractography will be described and illustrated with examples from recent experiments on sapphire.Citation
Journal of Failure Analysis and Prevention
Volume
6
Issue
3
Pub Type
Journals
Keywords
fractography, fracture, sapphire, x-ray topography
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 15, 2006, Updated February 19, 2017