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X-Ray Topography for Fractography of Single-Crystal Components

Published

Author(s)

David R. Black, George D. Quinn

Abstract

X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of single-crystal samples both before and after fracture. It can find strength and performance limiting surface and subsurface flaws that are undetectable by other methods or are detectable only with great difficulty and provides a complementary view of the fracture surface. The attributes of synchrotron based x-ray topography as applied to fractography will be described and illustrated with examples from recent experiments on sapphire.
Citation
Journal of Failure Analysis and Prevention
Volume
6
Issue
3

Keywords

fractography, fracture, sapphire, x-ray topography

Citation

Black, D. and Quinn, G. (2006), X-Ray Topography for Fractography of Single-Crystal Components, Journal of Failure Analysis and Prevention (Accessed July 18, 2024)

Issues

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Created June 15, 2006, Updated February 19, 2017