Strength Limiting Surface Damage in Single-Crystal Sapphire Imaged by X-Ray Topography

Published

October 1, 2001

Author(s)

David R. Black

Abstract

X-ray diffraction topography has been used to investigate the relationship between sub-surface damage and fracture strength in sapphire modulus of rupture (MOR) bars. The bars were indistinguishable using standard optical characterization techniques, but x-ray diffraction topography revealed that they were of two distinct types. The first type had an oriented microstructure consisting of a pattern of linear features running the length of the bars. This microstructure was attributed to fabrication damage. The second type was typical of well-polished, damage-free sapphire. Fracture strength data showed that the damaged bars had strengths less than 70 % of the bars without damage.

Citation

Journal of the American Ceramic Society

Volume

84

Issue

No. 10

Pub Type

Journals

Keywords

sapphire, surface damage, topography, x-ray diffraction

Citation

Black, D. (2001), Strength Limiting Surface Damage in Single-Crystal Sapphire Imaged by X-Ray Topography, Journal of the American Ceramic Society (Accessed October 9, 2025)