Black, D.
(2001),
Strength Limiting Surface Damage in Single-Crystal Sapphire Imaged by X-Ray Topography, Journal of the American Ceramic Society
(Accessed July 17, 2025)
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Strength Limiting Surface Damage in Single-Crystal Sapphire Imaged by X-Ray Topography
Published
Author(s)
Abstract
X-ray diffraction topography has been used to investigate the relationship between sub-surface damage and fracture strength in sapphire modulus of rupture (MOR) bars. The bars were indistinguishable using standard optical characterization techniques, but x-ray diffraction topography revealed that they were of two distinct types. The first type had an oriented microstructure consisting of a pattern of linear features running the length of the bars. This microstructure was attributed to fabrication damage. The second type was typical of well-polished, damage-free sapphire. Fracture strength data showed that the damaged bars had strengths less than 70 % of the bars without damage.Citation
Journal of the American Ceramic Society
Volume
84
Issue
No. 10
Pub Type
Journals
Keywords
sapphire, surface damage, topography, x-ray diffraction
Citation
Issues
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Created October 1, 2001, Updated February 19, 2017