Black, D.
, Polvani, R.
and Quinn, G.
(2001),
Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics, Ceramic Transactions
(Accessed May 5, 2024)
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Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics
Published
Author(s)
, ,
Abstract
X-ray topography provides a unique view of the surfaces of single-crystal samples, both before and after fracture. The diffraction topograph, which is sensitive to local strain and/or crystallographic orientation, can be used to inspect samples prior to testing and aid in the interpretation of fracture data. We will describe the attributes of x-ray topography as applied to fracture studies and illustrate these with examples from recent experiments with sapphire optical components.Citation
Ceramic Transactions
Volume
122
Pub Type
Journals
Keywords
fracture, sapphire, x-ray diffraction, x-ray topography
Citation
Created October 1, 2001, Updated February 19, 2017