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Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics

Published

Author(s)

David R. Black, Robert S. Polvani, George D. Quinn

Abstract

X-ray topography provides a unique view of the surfaces of single-crystal samples, both before and after fracture. The diffraction topograph, which is sensitive to local strain and/or crystallographic orientation, can be used to inspect samples prior to testing and aid in the interpretation of fracture data. We will describe the attributes of x-ray topography as applied to fracture studies and illustrate these with examples from recent experiments with sapphire optical components.
Citation
Ceramic Transactions
Volume
122

Keywords

fracture, sapphire, x-ray diffraction, x-ray topography

Citation

Black, D. , Polvani, R. and Quinn, G. (2001), Using X-Ray Topography to Study Fracture of Single-Crystal Ceramics, Ceramic Transactions (Accessed April 23, 2024)
Created October 1, 2001, Updated February 19, 2017