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NIST Authors in Bold

Displaying 2226 - 2250 of 2737

Strengths and Limitations of Surface Texture Characterization Techniques

January 1, 2001
Author(s)
Theodore V. Vorburger
Surface finish is important to the function of a wide range of industrial components including highways, ship hulls and propellers, mechanical parts, semiconductors, and optics. Hence, many documentary standards have been developed for specifying surface

Ultrastable Laser Array at 633 nm for Real-Time Dimensional Metrology

January 1, 2001
Author(s)
Y Lecoq, J Pedulla, John Lawall
We describe a laser system for very high-accuracy dimensional metrology. A sealed-cavity helium-neon laser is offset-locked to an iodine-stabilized laser in order to realize a secondary standard with higher power and less phase noise. Synchronous averaging

1,6-Hexanedithiol Monolayers on Au(111): A Multi-Technique Structural Study

December 29, 2000
Author(s)
T Leung, M Gerstenberg, D J. Lavrich, G Scoles, F Schreiber, G Poirier
Monolayers of 1,6-hexanedithiol [HS(CH 2) 6SH] deposited on Au(111) from the gas phase were characterized by scanning tunneling microscopy (STM), grazing incidence X-ray diffraction (GIXD), and low energy atom diffraction (LEAD). Molecular resolution STM

SIM Comparison of Electrical Units

December 1, 2000
Author(s)
Harold Sanchez, J. Cioffi, H. Laiz, D. Bennett, H. Ferreira, R. Ortega, Nile M. Oldham, Mark E. Parker
An international comparison of dc and low-frequency electrical units conducted between 19 laboratories in 16 countries in the Americas is described. The comparison was conducted between 1997 and 1999 and sponsored by the Interamerican Metrology System and

NIST/SEMATECH Collaboration: Application of Nano-Tips to Production CD-SEMs

November 15, 2000
Author(s)
Andras Vladar, Michael T. Postek
This work documents the first part of a two-part study about the application of nano-tips to critical dimension (CD) scanning electron microscopes used in integrated circuit production. Nano-tips, by comparison to all conventional cold, thermally assisted

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy

November 1, 2000
Author(s)
A Kalukin, B Winn, Yong Wang, C Jacobsen, Z Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray microscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are

Development of NIST Standard Bullets and Casings Status Report

November 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Alim A. Fatah
In April 1998, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). In October 1999, prototype standard casings were also developed at NIST. The standard bullets and casings are intended for use in

Dimensional Metrology of Millimeter- and Sub-millimeter-scale Components

October 1, 2000
Author(s)
Theodore V. Vorburger, Jun-Feng Song, Joseph Fu, M Tundermann, Thomas Brian Renegar, Theodore D. Doiron, N G. Orji
Decreasing sizes and tolerances of engineering components bring a demand for decreasing uncertainty in the dimensional measurements of these parts. Hence there is increasing need for measuring machines capable of performing dimensional and geometrical

Form Error and Hardness Performance of Rockwell Diamond Indenters

September 1, 2000
Author(s)
Jun-Feng Song, Samuel R. Low III, Li Ma
The influences of form errors on hardness performance of Rockwell diamond indenter are discussed. Experimental results are introduced. The Finite Element Analysis (FEA) method is used to simulate the hardness measurement process. The effect of tip radii

Broadband Ac-dc Difference Calibrations of Current Shunts up to 100 A at NIST

July 1, 2000
Author(s)
Joseph R. Kinard Jr., Thomas E. Lipe Jr., Clifton B. Childers, Owen B. Laug, Jon R. Pratt
NIST is now offering broadband, ac-dc difference calibrations of current shunts from 3 A to 100 A, and at frequencies up to 30 kHz, as special tests. We present an overview of this new service including the design and construction of the NIST standard

Capability in Rockwell C Scale Hardness

July 1, 2000
Author(s)
Walter S. Liggett Jr, Samuel Low, David J. Pitchure, Jun-Feng Song
A measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To establish the capability of a system for Rockwell C scale hardness, one must assess measurement

Evaluation of Standards for a 10 V MAP Service at NIST

July 1, 2000
Author(s)
Yi-hua D. Tang, June E. Sims
A Measurement Assurance Program (MAP) provides a method of assessing and maintaining the quality of a measurement process. Such a program has two parts: the operation of a set of statistical tools to ensure the predictable behavior of the standards and

Low-Frequency Impedance Calibrations at NIST

July 1, 2000
Author(s)
Andrew D. Koffman, Yui-May Chang
This paper presents an overview of the low-frequency impedance measurement services offered through the Impedance Calibration Laboratory (ICL) at the National Institute of Standards and Technology (NIST). Emphasis will be given to recent improvements as

Proposed Bullet Signature Comparisons Using Autocorrelation Functions

July 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger
The National Institute of Standards and Technology (NIST) standard bullets and casings are intended as reference standards for crime laboratories to help verify that the computerized optical-imaging equipment in those laboratories is operating properly
Displaying 2226 - 2250 of 2737
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